Nondestructive identification of multiple flaws using XFEM and a topologically adapting artificial bee colony algorithm

Abstract

SUMMARYWe present a novel algorithm based on the extended finite element method (XFEM) and an enhanced artificial bee colony (EABC) algorithm to detect and quantify multiple flaws in structures. The concept is based on recent work that have shown the excellent synergy between XFEM, used to model the forward problem, and a genetic‐type algorithm to solve an inverse identification problem and converge to the ‘best’ flaw parameters.In this paper, an adaptive algorithm that can detect multiple flaws without any knowledge on the number of flaws beforehand is proposed. The algorithm is based on the introduction of topological variables into the search space, used to adaptively activate/deactivate flaws during run time until convergence is reached. The identification is based on a limited number of strain sensors assumed to be attached to the structure surface boundaries. Each flaw is approximated by a circular void with the following three variables: center coordinates (xc, yc) and radius (rc), within the XFEM framework. In addition, the proposed EABC scheme is improved by a guided‐to‐best solution updating strategy and a local search (LS) operator of the Nelder–Mead simplex type that show fast convergence and superior global/LS abilities compared with the standard ABC or classic genetic algorithms.Several numerical examples, with increasing level of difficulty, are studied in order to evaluate the proposed algorithm. In particular, we consider identification of multiple flaws with unknown a priori information on the number of flaws (which makes the inverse problem harder), the proximity of flaws, flaws having irregular shapes (similar to artificial noise), and the effect of structured/unstructured meshes. The results show that the proposed XFEM–EABC algorithm is able to converge on all test problems and accurately identify flaws. Hence, this methodology is found to be robust and efficient for nondestructive detection and quantification of multiple flaws in structures. Copyright © 2013 John Wiley & Sons, Ltd.