Abstract
The photochemical reflectance index (PRI) of micropropagated potato leaves was estimated nondestruc- tively from outside the culture vessel using a PRI imaging system developed by the present group. The PRI was determined under low light intensity conditions after dark treatment and compared with the chlorophyll fluorescence parameter Fv/Fm, which denotes photosystem II maximum quantum yield. Short-term high-light treatment decreased Fv/Fm of the plantlets. Culture conditions such as temper- ature and sucrose concentration also affected Fv/Fm. A linear relationship between the PRI and Fv/Fm was observed in both cases of high-light treatment and different culture conditions, suggesting the potential of the PRI to be used as a substitute for Fv/Fm. PRI estimated from reflection images under low light intensity conditions may be used for rapid and noninvasive evaluation of photosyn- thetic properties of micropropagated plantlets in a similar manner to Fv/Fm.
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