Abstract

A C/SiC composite panel with defects of known size and of familiar nature was manufactured successfully for nondestructive evaluation. A computed tomography (CT) system was used to detect embedded defects. The results show that CT imaging corresponds well with the designed defects. The defect‐embedded composites undergo relatively greater loss in tensile strength and failure strain than the as‐received samples, although their initial Young's moduli are almost identical. It is also observed that the embedded defects make a significant contribution toward the initiation and accumulation of the damage in the composites, which result eventually in the early failure of the composite.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.