Abstract
Spectroscopy has long been a popular subject with respect to postal stamps, but analysis of postal stamps has been the subject of only a few spectroscopic studies. Fourier transform infrared techniques were used in developing a nondestructive technique to analyze the adhesives on the back of stamps. This factor is of importance since the value of a stamp is partially dependent on the conditions of the original adhesive. Diffuse reflectance was finally settled on as the method of choice for this analysis, and it shows great promise not only for stamp analysis but also for other types of documentation analysis as well.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.