Abstract
The energy transition and electrification across many industries place increasingly more weight on the reliability of power electronics. A significant fraction of breakdowns in electronic devices result from capacitor failures. Multilayer ceramic capacitors, the most common capacitor type, are especially prone to mechanical damage, for instance, during the assembly of a printed circuit board. Such damage may dramatically shorten the life span of the component, eventually resulting in failure of the entire electronic device. Unfortunately, current electrical production line testing methods are often unable to reveal these types of damage. While recent studies have shown that acoustic measurements can provide information about the structural condition of a capacitor, reliable detection of damage from acoustic signals remains difficult. Although supervised machine learning classifiers have been proposed as a solution, they require a large training data set containing manually inspected damaged and intact capacitor samples. In this work, acoustic identification of damaged capacitors is demonstrated without a manually labeled data set. Accurate and robust classification is achieved by using a one-class support vector machine, a machine learning model trained solely on intact capacitors. Furthermore, a new algorithm for optimizing the classification performance of the model is presented. By the proposed approach, acoustic testing can be generalized to various capacitor sizes, making it a potential tool for production line testing.
Highlights
T HE ONGOING ENERGY TRANSITION has resulted in exponential growth in the market for power electronics, with applications such as inverters and drives gaining ground in renewable energy production and the electrification of transport [1]
After extracting the features in Table 2 and composing the data set according to Table 3, the classification performance of the one-class support vector machine (OSVM) was evaluated for two objectives: to discover damaged multilayer ceramic capacitor (MLCC) and to avoid false alarms on undamaged capacitors
The data from intact printed circuit board (PCB) 2 were used for optimizing the hyperparameters using Cliffhanger (Algorithms 1 and 2), after which the OSVM was trained on the same data
Summary
T HE ONGOING ENERGY TRANSITION has resulted in exponential growth in the market for power electronics, with applications such as inverters and drives gaining ground in renewable energy production and the electrification of transport [1]. This places more weight on the reliability of power electronics devices, as their abrupt failure will cause costly repairs, downtime, and in worst cases, even life-threatening situations. Common examples of stress-induced damage include cracks in the dielectric material and delamination between internal electrodes or between the capacitor body
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