Noncontact atomic force microscopy imaging of ferroelectric domains with functionalized tips

Abstract

We report on an imaging method for ferroelectric domains by noncontact atomic force microscopy with dipole-molecule decorated tips. The Coulombic tip-sample interaction is revealing the domains monitored as an additional topography contribution. As proof of concept, we present agreement between numerical simulations and experiments on antiparallel out-of-plane domains on LiNbO3. This contact-free imaging technique promises substantially increased lifetime of read-heads for high-density ferroelectric data storages, and high resolution and improved image quality in scanning probe microscopy on systems with surface charge density variations.