Abstract
The aim of this paper is to propose a new spectral analysis method for an on-chip analog-to-digital converter (ADC) dynamic test. ADC characterization by spectral analysis has traditionally been done with discrete Fourier transform. This method imposes restrictions to optimize results; one of these is coherent sampling. Recently, some filter structures have been used for spectral analysis of a sinusoidal signal corrupted by harmonics and noise. In this paper, we present a new filter bank structure used for decomposing a signal into its main spectral components. The main application examined is ADC spectral parameter estimation, like signal-to-noise and distortion ratio, signal to noise ratio, total harmonic distortion, and so on, in noncoherent sampling. Computer simulations are used to demonstrate the performance of the proposed filter bank scheme. This structure is a promising built-in self-test (BIST) approach for ADC ICs.
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