Abstract

Impacts of electron inertia with an electron skin depth (ESD) longer than the realistic value used in early numerical studies on non-ideal ballooning modes (NIBMs) are numerically investigated by a linearized 3-field reduced MHD model. In this paper, 4 different ESDs,are used for an resistivity dependence study of the growth rate of NIBMs, where de s the real ESD and d*e = 10 corresponds to an order of ESD used in a numerical study on collisionless ballooning mode (CBM) reported in [Kleva and Guzdar Phys. Plasmas 6, 116 (1999)]. In the case with the real ESD d*e = de, a transition from resistive ballooning mode (RBM) to CBM occurs in the edge relevant resistivity regime, while the electron inertia effect is overestimated and the growth rate is almost independent of resistivity in the cases with d∗e =√10de and 10de. These results indicate that the real ESD is one of key factors for the edge stability and turbulence analysis.

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