Abstract
The paper describes the measurement of the electron mobility in semiconducting plates placed between two cylindrical antennas with diameterd−0·75λ0 by means of the microwave Faraday effect. This system enables (i) to measure the Faraday rotation in semiconducting plates of arbitrary transverse dimensions, greater or at least equal to the diameter of dielectric antennas, (ii) to evaluate the unknown value of the charge carrier mobility from the measured rotation in an unbounded solid state plasma slab approximation. The measurement of the Faraday rotation in n-type Ge plates are reported. The comparison of the experimental data with the theory shows good agreement.
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