Abstract
Stone chipping caused specific damages of coating systems, such as delamination, paint loss, or fracture of interlayer, were studied by Pulsed Phase Thermography. The measurement is based on the influence of individual barriers, which are created by defects, on the thermal heat flux. Defective and intact layer systems can be well distinguished, due to the clearly diverse return signals. We moreover demonstrate how the signals can be correlated with specific defects. The main advantages compared with currently used methods are the reliable and improved localization and identification of defects, as well as the significant reduction of measurement time.
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