Abstract
In this paper, multiple scattering of 662 keV gamma photons from targets of Carbon, Aluminium, Iron, Copper and polymers (Polypropylene, Polycarbonate, Polymethyl methacrylate, Polytetraflouroethylene and Polyvinyl chloride) is studied experimentally. Backscattered photons are detected by a NaI(Tl) detector placed at an angle of 90° to the incident beam. The single scattered events are reconstructed analytically to extract multiple scattered photons from the measured spectra. We observe that the number of backscattered photons increases with an increase in target thickness, and saturates at a particular value of the target thickness. This saturation thickness decreases with increasing atomic number of the target. The saturation thickness of the multiple scattering is used to assign effective atomic number of polymers. The experimental results are compared with the results obtained by Monte Carlo N-particle simulation code.
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