Abstract
Leaf area index (LAI) is widely used in many facets of potato (Solanum tuberosum L.) modelling but direct measurements have historically been difficult. This investigation tested the accuracy of a commercially available instrument (LI-COR LAI-2000) for measuring LAI non-destructively on a potato crop. Accurate estimates of LAI were difficult to obtain with small plots of≈1 m2. Results from larger field plots were extremely favourable and indicate that non-destructive measurements of LAI in situ can routinely be estimated within 5 to 10% of the destructively measured LAI. Six thinning tests performed on four potato cultivars produced average root mean square error measurements of LAI that ranged from 0.09 to 0.27.
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