Non-destructive electron microscopic examination with rotation of beveled micropipette electrode tips

Abstract

A method is described for non-destructive transmissive mode viewing of micropipette electrodes on an electron microscope by modifying the series 100 stage of a Cambridge S4 scanning electron microscope. The modified stage allows electrode rotation and movement in both the X and Y directions without altering the external controls of the electron microscope. We have used this technique to select dry beveled electrodes. The technique allows precise determination of optimal micropipette electrode tip size and shape for a specific purpose.