Non-Destructive Analysis of a High-Power Capacitor Using High-Energy X-ray Compton Scattering

Abstract

Changes in the internal state of a high-power capacitor during progressive charge–discharge cycling were measured non-destructively using high-energy synchrotron X-ray Compton scattering. The stacked structure of a laminated capacitor was clearly indicated by a Compton scattered X-ray intensity analysis and a line shape (S-parameter) analysis of a Compton scattered X-ray energy spectrum. Moreover, apparent differences in the progress of charge and discharge cycles were observed in the correlation between Compton scattered X-ray intensities and S-parameters obtained from the center and edge positions within the in-plane of the electrode. This difference in the correlation was obtained from the shifting of the stacked structure at the edge position, induced by the drift of the electrolyte material within the capacitor cells.