Noise-Shaping SAR ADC Using a Two-Capacitor Digitally Calibrated DAC With 82.6-dB SNDR and 90.9-dB SFDR

Abstract

A novel active noise-shaping SAR ADC with on- chip digital DAC calibration is presented. To relax the design of the single op-amp used as an integrator, correlated double sampling (CDS) and correlated level shifting (CLS) were implemented. CDS minimizes the offset of the integrator and reduces the flicker noise, while CLS boosts the gain of the op-amp and reduces the power consumption. Also, a two-step incremental ADC based digital DAC calibration scheme was implemented to cancel the DAC mismatch errors and parasitics effects. The ADC was fabricated in 0.13 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu \text{m}$ </tex-math></inline-formula> CMOS technology. It achieved 85.1 dB DR, 82.6 dB SNDR and 90.9 dB SFDR within a 2 kHz signal bandwidth with an oversampling ratio OSR = 32. It consumes 40.8 <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu \text{W}$ </tex-math></inline-formula> power using a 1.6 V power supply.