Abstract
Fiber optic sensors using white-light interferometry have been developed, among others, as absolute displacement sensors1, as strain or temperature sensors2. The main advantage of white-light interferometry, which uses broad band light sources with short coherence lengths rather than monochromatic sources, is the possibility to make absolute measurements. In the same manner, a broad band source allows to measure the absolute force from the induced birefringence in an optical fiber (Fig. 1). Scanning the interferogram in space, rather than in time, by a linear photodiode array (electronically-scanned interferometer) avoids moving parts and increases the mechanical stability of the system. In this paper, we present a new signal processing method for white-light interferometry which is fast, accurate, and extremely noise resistant. Theoretical results for the expected systematic and statistical errors will be compared with experimental results.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
