Abstract
A new approach to investigate noise spikes due to regeneration in a relaxation oscillator is proposed. Noise spikes have not been satisfactorily accounted for in traditional phase noise models. This paper attempts to explain noise spikes/jump phenomenon by viewing it as phase change in the physical world (for example, from gas to liquid or magnetization of ferromagnet). Both are due to regeneration (positive feedback in oscillator as well as alignment of spin due to positive feedback in ferromagnet). The mathematical tool used is the action path integral based on Lagrangian. As a first step towards this explanation in this paper, simulations on circuits using 0.18µm CMOS as well as simulations on ferromagnet (Ising model) were performed and both show jump phenomenon, illustrating the viability of this approach.
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