Abstract
Engineers designing optical alignment servo systems for Michelson interferometers and Fourier-transform infrared spectrometers need to predict the amount of noise expected from the small and randomly varying amounts of misalignment that occur as the servo attempts to maintain alignment while taking data. A formula is derived for the noise-equivalent change in radiance due to this effect and the formula's accuracy is demonstrated by comparison of its predictions to the errors found in simulated interferometer measurements contaminated by misalignment noise.
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