Noise-aware design for ESD reliability in mixed-signal integrated circuits

Abstract

The design of electrostatic discharge (ESD) protection network in CMOS technology becomes increasingly more difficult because of shrinking device feature sizes, high operating speed, and system on a chip (SoC) environment. For SoC protection, many additional considerations are required such as complex power bus architecture, area overhead by protection circuits, and noise isolation during normal operations. We present a novel noise-aware design technique for superior noise margin and improved ESD reliability. The use of hierarchical electrostatic discharge (HED) provides a low impedance discharge path for any ESD event with smaller protection circuitry. The estimation of maximum power/ground voltage in digital circuits is helpful to determine an optimal topology of power clamp circuits subject to noise constraints. Experimental results demonstrate the effectiveness of this method.