Noise tolerant N-order phase unwrapping system

Abstract

The present work shows preliminary results of a phase unwrapping technique used in interferometry. Wrapped phase maps are the result of the modulus 2π ambiguities caused for the phase recovery function arctan. Here we present a recursive n-order phase unwrapping system that removes the ambiguities, it's robust to noise and fast. The system is able to recover the unwrapping phase in presence of high noise, according to stability of the system that can be controlled. This high noise causes line sequential integrations of phase differences to fail. The system is not numerically-heavy in comparison with other methods that tolerate the noise. The application areas of the system can be: optical metrology, magnetic resonance, and those imaging systems where information is obtained as a demodulated wrapped phase map.