Noise resistance: a key factor in the metrological applications of highly entangled multiqubit states

Abstract

The advent of quantum entanglement has revolutionized metrology, enabling the development of ultra-precise measurement techniques that surpass the limitations of classical systems. However, the delicate nature of entangled states makes them vulnerable to various noise sources, significantly impeding their metrological utility. To address this challenge, we delve into the intricate relationship between noise and the metrological usefulness of highly entangled multiqubit systems. By studying the impact of various factors, we aim to unravel the fundamental limits of quantum metrology and devise strategies to enhance the resilience of quantum systems against noise. Our investigation reveals that increasing the number of qubits in an entangled state can significantly enhance its noise robustness, particularly for certain entangled states. Furthermore, we uncover the surprising advantage of utilizing different local operators, surpassing the robustness offered by the conventional identical-operator approach. Additionally, by employing a technique that utilizes multiple copies of the quantum state, we identified many states with latent metrological usefulness and demonstrated their hidden noise robustness. While these strategies significantly enhance the robustness of many studied states, it is crucial to note that generalizations may not apply universally. Therefore, validating these findings for each specific state is essential before practical implementation. Our findings proved that by rigorously assessing noise susceptibility and adopting appropriate strategies, we can achieve substantial gains in precision and noise robustness. This paves the way for the development of more robust and reliable quantum metrological techniques, offering valuable insights across a wide range of applications, from fundamental physics to cutting-edge technologies like quantum computing, sensing, and communication.