Abstract
High Tc dc SQUIDs are fabricated using bicrystal junctions with 30° misorientation angle, and noise property of the SQUIDs is measured at T = 77 K. The critical-current fluctuation S Io 1/2 is estimated from the flux noise in the low frequency region. And the relationship between S Io 1/2 and junction parameters such as the critical current I 0 and the resistance R s is discussed. It is also shown that the flux noise in the white noise region depends strongly on the transfer function V and that V should be lager than 100 μV/Φ0 in order to realize low noise SQUID with L = 100 pH. The experimental values of the white noise, however, are 2 or 3 times higher than the simulation.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
