Abstract
Co 85Cr 13Ta 2/Cr bilayered films for longitudinal recording disks were deposited by plasma-enhanced facing targets sputtering apparatus on 2.5 in and ultra-flat disk substrates of glass-ceramic and single-crystal silicon. Their noise and read/write characteristics were almost comparable with those of the high-performance disks using Co–Cr–Pt films, with coercivity H c of 2.4 kOe, as a reference disk, even though the Co–Cr–Ta films exhibited macroscopic H c of only 800 Oe. Co 85Cr 13Ta 2 films are known as low-noise media. This study addresses the problem of how to obtain low-noise media, using excellent sputtering apparatus and disk substrate materials, to allow practical applications in ultra-high-density recording systems, including 1 in microdrives for mobile applications.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
