Abstract
Between 20 Hz and 10 KHz vanadium pentoxide xerogel films of 5–150 nm thickness display 1 f noise with a power spectrum S G(⨍) ∝ ⨍ −1.1 . The upper limit of the free charge carrier concentration determined from noise measurements (10 17 − 6 × 10 18 cm −3 with weak dependence of thickness) is approximately two orders of magnitude higher than that of V 2O 5 single crystals but several orders of magnitude lower than the V 4+ concentration (∼ 2 × 10 20 cm −3) in the films suggesting that hydration increases the number of V 4+ ions active in the conduction process.
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