Abstract

The spatial and temporal noise factors that set the ultimate performance limits on dynamic infrared scene projectors are assessed. Fixed pattern noise and the needs for non-uniformity correction procedures are both discussed, followed by a detailed analysis of the temporal and residual spatial noise contributions within the projector/imaging unit-under-test (UUT) composite system. It is found that the system is more tolerant to projector spatial noise by a factor of about four compared to UUT spatial noise. The temporal and spatial noise contributions are combined appropriately in order to provide guidance as to the levels of array uniformity that will need to be achieved if the expected demands for fine temperature resolution are to be met.

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