Abstract
A built-in self-test (BIST) approach for functionality measurements, including noise figure (NF), linearity and frequency response of analog circuitry in mixed-signal systems, is presented. The BIST circuitry consists of a direct digital synthesizer (DDS) based test pattern generator (TPG) and a multiplier/accumulator based output response analyzer (ORA). The BIST approach has been implemented in hardware and used for actual NF measurements for comparison with measurements from external test equipment.
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