Noise correction for roughening analysis of magnetic flux profiles in YBa $_\mathsf{2}$ Cu $_\mathsf{3}$ O $_\mathsf{7-x}$

Abstract

The presence of experimental noise may greatly reduce the accuracy of experimentally determined growth and roughness exponents, which characterize a growing self-affine interface. A separate determination of the experimental noise enables a straightforward correction, which we demonstrate on experiments on the roughening of magnetic flux profiles in the critical state of YBa2Cu3O7-x thin films. After noise correction, we find that the magnetic field profile is characterized by a roughness exponent \(\alpha = 0.75(6)\). The growth exponent of the profiles is \(\beta = 0.7(1)\).