Abstract
ABSTRACTThe absorption properties of high quality bulk Si1−xGex single crystals (0 ≤ × ≤ 0.16) are studied. Transmission measurements were performed at the indirect absorption edge. The shape of the absorption edge is characterized by structures attributed to the onset of no-phonon and phonon-assisted indirect optical transitions. Threshold energies have been determined using a differential method. A corrected calibration function for the dependence of the excitonic energy gap on composition is presented for the compositions, where x ranges from 0 to 0.16. The presented calibration function can be used for the composition analysis by an optical method. The analysis is independent of absolute transmission values.A simulation of the absorption spectra by calculations based on second order perturbation theory was used to fit the experimental data This procedure allows to estimate the oscillator strength of the no-phonon transition in dependence on x.
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