Abstract
Abstract Annealing behaviour of nitrogen in helium-implanted α-Fe has been studied using the (p, p) resonance broadening technique to probe the depth profiles of nitrogen. By comparing the measured N profiles with the calculated vacancy and depth profiles of He it was observed that migrating nitrogen first occupies the He damaged sites and then the sites corresponding to the He range distribution. The calculated and experimental profiles were in excellent agreement. As a by-product of the trapping procedure the activation energies of the nitrogen dissociation from He-vacancy complexes and pure α-Fe and the modal ranges of the 5–60 keV He in α-Fe were extracted.
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