Abstract
AbstractA brief description is given of three databases issued by the US National Institute of Standards and Technology (NIST). These databases, designed principally for applications in Auger‐electron spectroscopy (AES) and X‐ray photoelectron spectroscopy (XPS), provide electron elastic‐scattering cross sections, electron inelastic mean free paths, and electron effective attenuation lengths. Examples are given of their use. Copyright © 2005 John Wiley & Sons, Ltd.
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