Abstract
X-ray photoelectron spectroscopy (XPS) and low energy electron diffraction (LEED) were used to characterize a clean and highly-oriented Ni(100) single crystal. The Ni(100) crystal was cleaned and ordered with a combination of Ar-ion bombardment and annealing. There were no contaminants observed in XPS. The XPS binding energies were referenced to the Fermi edge of the clean nickel crystal.
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