New studies of X-ray diffraction line profiles from aggregates of distorted crystallites I

Abstract

The fourth central moment of an X-ray diffraction profile from an aggregate of distorted crystallites has been expressed by Mitra (1964a) as a function of the crystallite size, strain and strain gradients in the specimen. While the usual methods of line profile analysis yield information regarding either the apparent strain or the rms strain, the present study provides additional information regarding strain distribution in the form of strain derivatives and rms displacements of atoms over a given distancet in the direction of study. The strain parameters like 〈ee′〉, 〈ee″〉 have been obtained from fourth moment of the strain profile against range plots. The strain parameters thus obtained have subsequently been used to determine the rms displacements of the atoms. Alloys of copper and zinc at different stages of cold working and annealing have been studied by this method. The results have been discussed in the light of dislocation distribution, polygonisation and grain growth as well as distortion waves in the distorted crystals.