Abstract

This paper describes new topologies of silicon drift detectors dedicated to high resolution time- and energy-resolved X-ray imaging. We will discuss the design features and performances of the Controlled Drift Detector (CDD), a new detector topology featuring 2-D position sensing and energy spectroscopy of X-rays in the range 1-20 keV with a frame rate up to 100 kHz. In addition we will discuss the potential application of Multi-Linear Silicon Drift Detectors to high resolution X-ray spectroscopy at high counting rates. These detectors feature parallel columns permanently biased in drifting mode and a topology particularly suitable to optimize the signal-noise ratio of the readout section. Examples of radiographic images and tomographic 2D and 3D reconstructions of phantoms and biological samples acquired at 300 K at Sincrotrone Trieste are shown together with the spectroscopic analysis of each pixel. The timing capability of the CDD has been successfully tested by imaging the X-rays shaped by a mask vibrating at acoustic frequency with a time resolution down to 10/spl mu/s.

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