Abstract

Due to the shortcoming of linear normalization for sensitivity in electrical tomography system, nonlinear formulas are derived about electrical resistance tomography (ERT), capacitance tomography (ECT) and electromagnetic tomography (EMT). Those formulas are deduced according to the characteristics of analytical solution and system structure. The role of normalization in data processing is introduced. Logarithmic normalization formula is summarized for ERT. In ECT, parallel model and serial model are introduced, and nonlinear formulas are described depending on real distribution in object field. Mainly, special normalization formula is deduced.

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