Abstract
A random rotation approach has been suggested herein to tackle the problems of relative and exterior orientations. This new method circumvents the problem posed with iterative solutions. Problems of relative and exterior orientations may be reduced to a common form, from which they would appear simply as the problems of absolute orientation. Thus, exterior and relative orientations are not problems in analytical photogrammetry. The results obtained during the course of investigations carried by the writer are encouraging. Some more applications of this approach may be envisaged in other fields of analytical photogrammetry.
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