Abstract
The main principles, new possibilities, and instrumental implementations of a structure-sensitive spectroscopy of the surface of condensed media probed by X-ray standing waves (XSWs) are considered in the case of electron emission under the action of continuous resonant X-ray Raman scattering. It is shown that prospects for the development and use of the new possibilities offered by the XSW method for surface investigations are related to the creation of a set of specific experimental equipment and special sources of synchrotron radiation.
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