Abstract
A new position error signal (PES) generation method for scanning probe microscope (SPM) based Data Storage (SDS) system is proposed. In this paper, instead of pits used by the conventional methods, two stripe patterns (sync and PES patterns) are used. The two patterns can be either etched or nano imprinted for mass production. In the proposed method analog-to-digital converters are no longer needed. Instead, a simple digital counter and phase locked loop logic along with analog comparators are used. We present how to construct PES, and investigate its quality degradation due to manufacturing uncertainties such as misalignment during assembly process and scanning speed jitters. Simulation and experimental results with PES quality analysis were presented to confirm the validity of the proposed patterns.
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