Abstract
We describe a method for measuring the response of ferroelectric thin films to microwave-frequency electric fields. A mode-locked Ti:sapphire laser is used to generate a microwave drive signal that is phase locked to an optical probe pulse. The induced polarization change in the ferroelectric film is measured stroboscopically via the electro-optic effect. Images are acquired by scanning the laser beam across the sample in a confocal geometry. Time resolution is achieved by changing the delay between the electrical pump and the optical probe. Initial results show large local phase shifts in the ferroelectric response of closely separated (1 μm) regions of a Ba0.5Sr0.5TiO3 thin film. This new experimental technique may help to understand the physical mechanisms of dielectric loss in these materials.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
