Abstract
This article presents a quantitative analysis of charged Soft Matter system using Anomalous Small-Angle X-Ray Scattering (ASAXS). Specific experimental requirements and data reduction are described. The simultaneous analysis of data sets recorded below and above the absorption edge provides valuable constraints in data modelling. The merit of the method is illustrated by an example involving cationic surfactant micelles. The counterion profile around the micelle is deduced in a self-consistent manner and the results reveal the strong condensation of counterions on to the micellar surface.
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