Abstract

The discovery of a new poly(3,4-ethylenedioxythiophene) (PEDOT) composite with unique memory characteristics has led to the demonstration of durable Organic ElectroChemical Transistors (OECT) based memory devices. The composites of PEDOT with polytetrahydrofuran undergo a structural collapse during electrochemical reduction that requires approximately 800 mV overpotential to re-open and is thus hindering the re-oxidation of the composite. This effect causes the composite at intermediate potentials to be able to have two different oxidation states and thereby resistances, depending on the “on” or “off” switching potential applied prior to the intermediate potential. Notably, this hysteresis is lasting over time and no drift has been observed. Impedance spectroscopy, in-situ UV-Vis spectroscopy, conductivity measurement, in-situ electrochemical quartz crystal microbalance, and differential scanning calorimetry were used to confirm and explain the switching memory phenomena. The OECT platform was used to validate the PEDOT:PTHF as a one-pot memory source-drain material where a threefold increase in drain current was observed between “off” and “on” mode of the transistor after modulation of the Ag/AgCl gate.

Highlights

  • The discovery of a new poly(3,4-ethylenedioxythiophene) (PEDOT) composite with unique memory characteristics has led to the demonstration of durable Organic ElectroChemical Transistors (OECT) based memory devices

  • The current manuscript describes an exemption from this general trend where incorporation of poly(tetrahydrofuran) (PTHF) in poly(3,4-ethylenedioxythiophene) (PEDOT) introduces a very significant and stable hysteresis effect, which makes this composite material a unique candidate for “one-component” memory devices

  • In-situ electrochemical quartz crystal microbalance (QCM) measurements were performed and scanning to lower potentials than −0.5 V vs standard calomel electrode (SCE) introduced a significant hysteresis in the weight change, where the re-uptake of counter-ions during oxidation were delayed till −0.1 V vs SCE, i.e., the same potential range where the electrochemical oxidation wave is observed

Read more

Summary

Introduction

The discovery of a new poly(3,4-ethylenedioxythiophene) (PEDOT) composite with unique memory characteristics has led to the demonstration of durable Organic ElectroChemical Transistors (OECT) based memory devices. The OECT platform was used to validate the PEDOT:PTHF as a one-pot memory source-drain material where a threefold increase in drain current was observed between “off” and “on” mode of the transistor after modulation of the Ag/AgCl gate.

Results
Conclusion
Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.