New method to determine diffusion coefficients and surface rate constants in mixed ionic electronic conductors

Abstract

A new mathematical method to estimate diffusion coefficients ( D) and surface rate constants ( k) in mixed ionic electronic conductors has been developed. The so-called intersection line method neglects the dependency of D and k pairs on initial values like classical optimization programs do. The important advantages of the new developed method against classical optimization procedures in terms of independence of initial values and precision by finding the physically meaningful solution have been shown.