Abstract
New method of electron beam transverse size measurement by angular distribution of emission in a thin crystal
Highlights
The divergence and transverse dimensions of accelerated particles beams are important parameters of any accelerator
The dimensions are determined from the results of a least squares method procedure with varying parameters, where the adjustable function is the distribution for a shorter distance and the fitting function is the convolution of the angular distribution at a greater distance with a twodimensional Gaussian distribution whose parameters are uniquely related to the beam dimensions on the target and the distances between the crystal and the detector
The transverse size of a particle beam σx;y in a linear electron accelerator can be determined by measuring the two-dimensional angular distributions of the particle radiation in thin crystals: parametric x-ray radiation (PXR) or DTR for two distinct distances between the crystal and the coordinate detector
Summary
The divergence and transverse dimensions of accelerated particles beams are important parameters of any accelerator. The use of a pinhole camera assumes an azimuthal symmetry of the angular distribution of the detected radiation; if this is not the case, an error will arise in determining the beam dimensions from the measurements [8] Another significant disadvantage of the method in Ref. From the foregoing, it is important and relevant to conduct an analysis of the dependence of the angular distributions of the coherent radiation of electrons in crystals from the beam dimensions, the observation angle, and other experimental conditions, aimed at developing a new technique for determining the transverse dimensions of electron beams of high energy Another method of beam size measurement is the use of so-called wire scanners [11,12,13]. To determine the strengths and weaknesses of the suggested new method as an alternative to existing methods, it is instructive to compare it with the wire scanner method
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