Abstract
A new charge-compensation method in monochromatized X-ray photoelectron spectroscopy has been successfully applied to the surface analysis of nonconductive materials such as ETFE and PET films, In this method unmonochromatized Mg X-rays are used effectively as an electron source for neutrallizing the sample chrging. Continuity of secondary electron energies produced by Bremsstrahlung radiations may play an important role in charge-neutralization process.
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