Abstract

We have developed a device for dynamic measurements of the quality factor of high Q resonating cavities by plotting the dispersion curve of the resonator on the screen of an oscilloscope. The width of the dispersion curve is well defined by the two extremes. We built our apparatus at 9000 Mc because our aim was measurements on neutron irradiated glasses, the dielectric losses of which, expressed as the power factor tanδ, seem especially significant at these frequencies. We used a 2K25 reflex klystron as rf generator and the standard X-band waveguide plumbing. The method can be used, however, at any frequency at which one works with waveguide or coaxial techniques.

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