Abstract
In this study, we present a new gamma spectrum processing method is applied to analyze experimental scattering spectra on aluminum and steel for determining the intensity of the single scattering component. Based on these results, the saturation depth of aluminum and steel materials are 78.8 and 22.5 mm, respectively. The thickness of both materials is determined with a maximum relative deviation of about 7% in comparison with real thickness. Besides, the result also shows that we can use the new spectrum processing method, which is a simple, and useful solution to determine the material thickness, for NaI(Tl) detector and a low activity source.
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