Abstract
Two new metastable phases have been observed by means of transmission electron microscopy in a Pd/amorphous Si bilayer after annealing at 185 °C. One phase (NSA) is of a b.c.t. structure with a = 0.390 nm and c = 0.540 nm, and the other phase (NSB) is of two-dimensional hexagonal structure with a = 0.521 nm, whose reciprocal lattice points become continuous spikes in the c ∗ direction of the reciprocal lattice.
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