New Insights into Ferroelectric Domain Imaging with Piezoresponse Force Microscopy

Abstract

AbstractPiezoresponse Force Microscopy (PFM) has become the most used technique for non-invasive mapping of ferroelectric domain patterns. For PFM imaging, no specific sample preparation is required: any clean and flat surface that can be imaged by scanning force microscopy can also be investigated by PFM. Despite its ease of use, PFM imaging allows to detect the domain distribution with high lateral resolution and an amazing sensitivity. As a consequence, the PFM mode has become a standard for commercial scanning force microscopes. PFM, however, still causes difficulties in terms of interpretation of the images obtained. The situation becomes even more delicate, when trying to obtain quantitative data based on PFM images.In this chapter, we intend to provide a deeper insight into PFM imaging and thereby permit a more reliable interpretation of PFM images. For this purpose we point to a couple of difficulties that one may encounter in PFM imaging, possibly leading to aha moments of the reader about having seen such PFM images without having been able to make sense of it, and propose solutions to the most common challenges, such as calibration to name the most prominent one.KeywordsFerroelectric DomainElectric Field ComponentPeriodically Pole Lithium NiobateScanning Force MicroscopyPiezoresponse Force MicroscopyThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.