Abstract

Beam profiling of high power (1 kW and higher) CO2 lasers has been limited to either antiquated acrylic mode burns or intrusive beam profiling devices. Neither of these devices can show the operator real-time laser beam spatial profiles while processing materials; in most cases, the process needs to be discontinued for the analyzer to be used. II-VI and Spiricon have developed a new in-line, continuous high power CO2 laser beam profiling device that can be used while processing materials, and does not interfere with the process. Using the Active-X® features of the Spiricon Laser Beam Diagnostic software, critical beam parameters can be sent to external process control programs for additional monitoring and even feedback control.Beam profiling of high power (1 kW and higher) CO2 lasers has been limited to either antiquated acrylic mode burns or intrusive beam profiling devices. Neither of these devices can show the operator real-time laser beam spatial profiles while processing materials; in most cases, the process needs to be discontinued for the analyzer to be used. II-VI and Spiricon have developed a new in-line, continuous high power CO2 laser beam profiling device that can be used while processing materials, and does not interfere with the process. Using the Active-X® features of the Spiricon Laser Beam Diagnostic software, critical beam parameters can be sent to external process control programs for additional monitoring and even feedback control.

Full Text
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