Abstract
X-ray photoelectron spectroscopy (XPS) has seen widespread use in applied and basic surface science studies since 1970. Its capabilities appear to be undergoing a series of improvements, due both to technological changes and to the culmination of efforts by the XPS community to solve a series of scientific questions that underlie the technique. This paper describes some of the advances made in the past 5 yr and uses two particular studies to illustrate the improvements: the use of mathematical deconvolution to study the initial and extended oxidation of nickel metal, and the use of XPS imaging to identify electrochemical processes during the pitting corrosion of a nickel-based alloy. Finally, the use of modern synchrotrons in further improving the spectroscopic capabilities of XPS will be described.
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