Abstract
A four-point technique has been developed for the resistivity measurement of industrial SiC rods. The superficial oxidation of SiC pellets has been characterised using the impedance spectroscopy technique, thermogravimetric analysis and S.E.M micrography.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Paper version not known
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
